Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1992-01-10
1993-09-14
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356318, 250339, 2504581, G01B 902
Patent
active
052454061
ABSTRACT:
A Fourier transform spectrometer for conducting Fourier transform spectroscopy. The spectrometer has a light source emitting light to a sample via a rapid scan interferometer. The transmittance of the sample varies when stimulated. A stimulus generator gives a stimulus to the sample at regular intervals of .tau.. A delay circuit produces a trigger delayed with respect to each stimulation to control a gate circuit. Radiation emanating from the sample is detected by a detector. The output signal from this detector is gated onto a low-pass filter after a given delay .DELTA..tau. with respect to each stimulation by the gate circuit. The gate circuit produces a digital interferogram. The low-pass filter passes only those frequency components which satisfy the condition:
REFERENCES:
patent: 4925307 (1990-05-01), Cremers et al.
patent: 5021661 (1991-06-01), Masutani
Jeol Ltd.
Keesee LaCharles
Turner Samuel A.
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