Fourier transform spectroscopy and spectrometer

Optics: measuring and testing – By particle light scattering – With photocell detection

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Details

356318, 250339, 2504581, G01B 902

Patent

active

052454061

ABSTRACT:
A Fourier transform spectrometer for conducting Fourier transform spectroscopy. The spectrometer has a light source emitting light to a sample via a rapid scan interferometer. The transmittance of the sample varies when stimulated. A stimulus generator gives a stimulus to the sample at regular intervals of .tau.. A delay circuit produces a trigger delayed with respect to each stimulation to control a gate circuit. Radiation emanating from the sample is detected by a detector. The output signal from this detector is gated onto a low-pass filter after a given delay .DELTA..tau. with respect to each stimulation by the gate circuit. The gate circuit produces a digital interferogram. The low-pass filter passes only those frequency components which satisfy the condition:

REFERENCES:
patent: 4925307 (1990-05-01), Cremers et al.
patent: 5021661 (1991-06-01), Masutani

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