Fourier-transform spectrometers

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

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Reexamination Certificate

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09922363

ABSTRACT:
A novel tilt-compensated interferometer geometry is described. The design uses tilt- and shear-compensation optics to simultaneously maintain high throughput and precise interferometric alignment, even in the presence of non-ideal scanning motions. The tilt-compensation mechanism consists of a novel beamsplitter/reflector assembly that produces two anti-parallel beams. A variety of enhancements to the basic design are described, providing a family of related interferometer designs. These interferometers have applications in spectrometry, spectral imaging and metrology.

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patent: 6654125 (2003-11-01), Maynard et al.

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