Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1996-06-20
1998-02-03
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01B 902
Patent
active
057150567
ABSTRACT:
A high S/N Fourier transform spectrometer with low A/D converter noise, comprising a light receiving device; a low gain channel and a high gain channel which convert to and retain as digital signals the output from the light receiving device; and a computation control unit which determines a correlation equation between the low gain and high gain channels and substitutes the low gain channel output converted using the correlation equation for the saturated portion of the high gain channel output.
REFERENCES:
patent: 4792230 (1988-12-01), Naganuma et al.
patent: 5110211 (1992-05-01), Niki et al.
Tanaami Takeo
Urabe Shuji
Kojima Moonray
Turner Samuel A.
Yokogawa Electric Corporation
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