Fourier transform mass spectrometer

Radiant energy – Ionic separation or analysis – Cyclically varying ion selecting field means

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250290, 250281, B01D 5944

Patent

active

052646971

DESCRIPTION:

BRIEF SUMMARY
TECHNICAL FIELD

The present invention relates to a Fourier transform mass spectrometer and, more particularly, to a Fourier transform mass spectrometer suitable generally for concentration analysis of any mixed gas samples including a so-called process analysis for process stream in chemical plants, a so-called medical gas analysis for carrying out analysis of metabolic functions and anesthetic states or monitoring them by analyzing respiratory gases or inhalation gases from or into the living body, a so-called evolved gases analysis for analyzing evolved gases for estimating the state of a surface of a semiconductor, a catalyst or the like or the progress of a reaction thereof from a gaseous component eliminating therefrom by heating them, or so on.


BACKGROUND ART

Heretofore, in many occasions, Fourier transform mass sepectrometers are adapted mainly for general organic analysis in order to identify an unknown component. Hence, a transmission unit supplying high-frequency electric field, mounted to the Fourier transform mass spectrometer, for forming an electric field for ionizing a gaseous sample has the function for sweeping a whole region of resonant frequency corresponding to a whole region of mass to be measured at a high speed so as to excite all kinds of ions.
Fourier transform mass spectrometer in the above mentioned field, however, it is said rather less often that an unknown component is required to be identified, but it is required in many occasions that the concentration of the particular known components in a mixed gas sample, to be analyzed is required and its temporal drift. In order to achieve such an object, a so-called calibration curve technique is adopted with the attempt to determine the concentration of a certain sample. In other words, a standard gas composed of known concentrations of the components is prepared for a gas components to be measured, and the relationships between the concentrations and an intensities of a spectral peaks measured are determined in advance. At the time of measurement, the concentration of a particular known component of the sample gas is corrected from the spectral peak intensity of the sample gas with reference to the relationships determined in advance. Hence, the necessary condition of accurate analysis is based on the fact that the peak to be measured is not superimposed whatsoever on any peak other than the component to be measured.
When the conventional Fourier transform mass spectrometers are employed in the field as described hereinabove, the conventional transmission unit excites ions which are not required for excitement, so that voltage of a signal to be induced into a receiving electrode of an analyzing cell amounts to a total sum of outputs caused by resonance from all the ions containing the unnecessary ions. As a consequence, an intensity of an ion cyclotron resonance signal of the ion to be induced is so restricted as not to exceed a dynamic range of analog-digital conversion, so that the ion to be measured cannot be excited until the ion cyclotron resonance signal of the ion to be measured becomes to a sufficiently high level.
Next, the conventional Fourier transform mass sepctrometer presents the problem that there is no correlation between a static magnetic field and the frequency to be irradiated. In other words, if a permanent magnet, an electric magnet or the like is employed, not a super-conductive magnet, application of the static magnetic field for a long term causes the irradiating frequency to deviate from the resonant magnetic field, thereby making the desired ion difficult to be excited.
Therefore, the object of the present invention is to provide a Fourier transform mass spectrometer which can solve the problems as described hereinabove and which is capable of making a ratio of the static magnetic field to the irradiating frequency constant so that an ion to be measured can be excited until a resonant signal of the ion becomes sufficiently high.
Another object of the present invention is to provide a compact Fourier tra

REFERENCES:
patent: 2808516 (1957-10-01), Lanneau
patent: 3530371 (1970-09-01), Nelson et al.
patent: 3742212 (1973-06-01), McIver, Jr.
patent: 3937955 (1976-02-01), Comisarow et al.
patent: 4500782 (1985-02-01), Allemann et al.
patent: 4761545 (1988-08-01), Marshall et al.
patent: 4933547 (1990-06-01), Cody, Jr.
E. B. Ledford, Jr. et al., "Exact Mass Measurement by Fourier Transform Mass Spectrometry," Anal. Chem., vol. 52, pp. 463-468, 1980.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fourier transform mass spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fourier transform mass spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fourier transform mass spectrometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1851323

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.