Fourier processor of photoelastic data and method of using same

Details Fourier processor of photoelastic data and method of using same Fourier processor of photoelastic data and method of using same

1979-05-16

1982-03-23

Rosenberger, R. A.

Optics: measuring and testing

Material strain analysis

With polarized light

350162SF, G01B 1118

Patent

active

043209661

ABSTRACT:
In the reflection polariscope using filter with four elements transmitting light of four different wavelengths each polarized in appropriate plane and a photoelastic coating having a built-in dichroic filter an image is recorded. The record is further processed in the Fourier processor using special filters to obtain certain potentials and/or the averaged strains in the photoelastic coating and strains in the coating-prototype interface.

REFERENCES:
patent: 3087148 (1963-04-01), Ludewig
patent: 3313204 (1967-04-01), Oppel
patent: 3544197 (1970-12-01), Weaver
patent: 3902805 (1975-09-01), Redner
patent: 3947123 (1976-03-01), Carlson et al.
patent: 4008960 (1977-02-01), Reytblatt

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