Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-04-18
2006-04-18
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S765010
Reexamination Certificate
active
07030633
ABSTRACT:
This invention provides an innovative multi-line structure and an effective four-terminal method for the resistivity measurement of semiconductor materials. The multi-line structure and the four-terminal method not only allow one to perform resistivity measurement on any inorganic and organic semiconductor thin film conveniently, rapidly and accurately but also offer the means to study resistivity uniformity across the semiconductor thin film.
REFERENCES:
patent: 4516071 (1985-05-01), Buehler
patent: 5552718 (1996-09-01), Bruce et al.
patent: 6118137 (2000-09-01), Fulford et al.
patent: 6836140 (2004-12-01), Fujikawa et al.
Qiu Chunong
Qiu Cindy X.
Xiao Steven Shuyong
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