Four point measurement technique for programmable impedance...

Details Four point measurement technique for programmable impedance... Four point measurement technique for programmable impedance...

2006-12-19

2006-12-19

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C324S763010, C714S734000

Reexamination Certificate

active

07152012

ABSTRACT:
A four point measurement technique for testing programmable impedance drivers such as the BZIO buffers contained in RapidChip® and ASIC devices. Specifically, two test pads are added for taking voltage measurements at additional points. By taking the additional voltage measurements and performing some calculation using Ohm's law, the error components of the testing process are effectively eliminated. The technique is suitable for use at wafer sort where additional device pads can be made available for contact with the automated test equipment (ATE) used in the manufacturing test environment.

REFERENCES:
patent: 4707620 (1987-11-01), Sullivan et al.
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 5642364 (1997-06-01), Farwell
patent: 5652722 (1997-07-01), Whitefield

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