Four-layer trapatt diode and method for making same

Metal treatment – Compositions – Heat treating

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148175, 148187, 148 33, H01L 2126

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active

040381064

ABSTRACT:
A method for making a four-layer P+PNN+ or N+NPP+ diode, and the diode, wherein the impurity profile about the PN junction is optimally graded for TRAPATT operation throughout the span of the avalanche region by ion implantation of the impurities to a depth of 1000A in a semiconductor wafer and wherein these impurities are subsequently thermally diffused.

REFERENCES:
patent: 3638300 (1972-02-01), Foxhall et al.
patent: 3660171 (1972-05-01), Tsuchimoto et al.
patent: 3745070 (1973-07-01), Yada et al.
patent: 3758875 (1973-09-01), Hayashi
patent: 3891468 (1975-06-01), Ito et al.
patent: 3926693 (1975-12-01), Kawamoto et al.

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