Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-05-10
2011-05-10
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S003000, C257S004000, C257S013000, C257SE29105, C438S900000
Reexamination Certificate
active
07939815
ABSTRACT:
By making an ovonic threshold switch using a carbon interfacial layer having a thickness of less than or equal to ten percent of the thickness of the associated electrode, cycle endurance may be improved. In some embodiments, a glue layer may be used between the carbon and the chalcogenide of the ovonic threshold switch. The glue layer may be effective to improve adherence between carbon and chalcogenide.
REFERENCES:
patent: 5159661 (1992-10-01), Ovshinsky et al.
patent: 5414271 (1995-05-01), Ovshinsky et al.
Chang Kuo-Wei
Deweerd Wim Y.
Diaz Aleshandre M.
Lee Jin-wook
Reid Jason S.
Iannucci Robert
Jorgenson Lisa K.
Pert Evan
Seed IP Law Group PLLC
STMicroelectronics S.r.l.
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