Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2007-08-21
2010-12-21
Landau, Matthew C (Department: 2813)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S700000, C438S702000, C438S703000, C438S704000, C438S712000, C257SE21249
Reexamination Certificate
active
07855151
ABSTRACT:
A slot is formed that reaches through a first side of a silicon substrate to a second side of the silicon substrate. A trench is laser patterned. The trench has a mouth at the first side of the silicon substrate. The trench does not reach the second side of the silicon substrate. The trench is dry etched until a depth of at least a portion of the trench is extended approximately to the second side of the silicon substrate (12). A wet etch is performed to complete formation of the slot. The wet etch etches silicon from all surfaces of the trench.
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Bhowmik Siddhartha
Braun David M.
Kommera Swaroop K.
Oram Richard J.
Ramamoorthi Sriram
Hewlett--Packard Development Company, L.P.
Landau Matthew C
Snow Colleen E
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