Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2005-12-20
2005-12-20
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Reexamination Certificate
active
06977721
ABSTRACT:
A foreign substance inspection apparatus1which obtains images of a powder material with a two-dimensional camera17and subjects the image data outputted from the camera17to image processing, whereby foreign substances mixed into the powder material are detected. The foreign substance inspection apparatus1comprises a rotatably supported container5with an opening surface in a substantially horizontal state; a liftably supported lift member7inside the container; a drive control device for controlling rotation of the container5and rise and fall of the lift member7;and a scraping plate25disposed on the opening surface3of the container5.The two-dimensional camera17is located so as to obtain images of the surface of the powder material that is exposed on the opening surface3.
REFERENCES:
patent: 4976540 (1990-12-01), Kitamura et al.
patent: 5157976 (1992-10-01), Tokoyama et al.
patent: 5239358 (1993-08-01), Tokoyama
patent: 5469752 (1995-11-01), Kitamura et al.
patent: 5727607 (1998-03-01), Ichikawa et al.
patent: 6454141 (2002-09-01), Breen et al.
patent: 7-48065 (1995-05-01), None
patent: 2000-146848 (2000-05-01), None
Patent Abstracts of Japan; 09281048; publication date: Oct. 31, 1997, cited in search report (abstract only).
Chen Cheng Yu
Chou Hsin Tan
Hoshi Noboru
Kawamura Kohachi
Yamamoto Taizo
Armstrong Kratz Quintos Hanson & Brooks, LLP
Mingtai Chemical Co., Ltd.
Nguyen Tu T.
Nisshin Kasei Co., Ltd.
Yamamoto Taizo
LandOfFree
Foreign substance inspection apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Foreign substance inspection apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Foreign substance inspection apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3481949