Foreign matter inspection apparatus and foreign matter...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Reexamination Certificate

active

07876431

ABSTRACT:
A foreign-matter inspection apparatus is implemented which allows the stable detection sensitivity to be maintained. A laser beam emitted from a laser apparatus is applied to a beam irradiation sample via an irradiation unit and a mirror. Then, the laser beam is captured into a beam-capturing camera via an image-forming lens and a beam-direction switching mirror. Based on the captured beam image, an image computational processing unit judges inclination of the laser beam, then adjusting the irradiation unit thereby to correct the inclination of the laser beam. Also, the beam is captured into the beam-capturing camera in specified number-of-times while focus of the laser beam is being changed by an arbitrary amount by the irradiation unit. Based on the captured beam, the focus of the laser beam is corrected by adjusting the irradiation unit.

REFERENCES:
patent: 3749496 (1973-07-01), Hietanen et al.
patent: 5583632 (1996-12-01), Haga
patent: 7187438 (2007-03-01), Hamamatsu et al.
patent: 7286218 (2007-10-01), Tiemeyer et al.
patent: 7414715 (2008-08-01), Wolters et al.
patent: 2005/0213086 (2005-09-01), Hamamatsu et al.
patent: 2005-283190 (2005-10-01), None

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