Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Patent
1996-08-06
1999-02-02
Cosimano, Edward R.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
338 2, 338 47, 338307, 338308, 338314, 36470711, G06F 03033, G01L 0118, H01C 1010
Patent
active
058678085
ABSTRACT:
A force transducer includes an elongated lever arm attached to a substrate having a central portion and substantially planar tab regions that project outwardly from the central portion along first and second orthogonal force-detecting axes. The substrate undergoes localized strain approximately at the junctions of the tab regions and the central portion when an external force is applied to the free end of the lever arm. A thick film strain gauge material is screen printed directly onto the substrate in at least a first location and a second location and conductive pads on the substrate are electrically coupled to the thick film strain gauge material at each location to define a first strain gauge oriented along the first force detecting axis and a second strain gauge oriented along the second force detecting axis. The lever arm can be of a compliant construction to provide proprioreceptive feedback to a user.
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Sanjay Chitale, Cornelius Huang, and Michael Stein, "High Gauge Factor Thick Film Resistors For Strain Gauges," reprinted from Hybrid Circuit Technology,May 1989, Lake Publishing Corp., Libertyville, Illinois (7 pages).
Kamentser Boris
Selker Edwin J.
Smith Barton A.
Cosimano Edward R.
International Business Machines - Corporation
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