Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1984-06-06
1986-06-17
Kreitman, Stephen A.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
7386259, G01L 110
Patent
active
045948984
ABSTRACT:
A piezoelectric beam structure for a vibrating beam force sensor in which three coplanar beams of piezoelectric material are spaced side by side and supported between respective common mountings at either end. The two outer counterbalancing beams in operation flex in opposite phase to the center main beam, with each beam flexing in a direction normal to the beam plane. A force sensor which includes this piezoelectric beam structure.
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patent: 3529470 (1970-09-01), Agar
patent: 4071838 (1978-01-01), Block
patent: 4215570 (1980-08-01), Eer Nisse
patent: 4372173 (1983-02-01), Eer Nisse et al.
patent: 4446394 (1984-05-01), Albert
Kirman Richard G.
Langdon Roger M.
Fisher Controls International Inc.
Kreitman Stephen A.
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