Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2006-08-22
2006-08-22
Gray, David M. (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
C073S862690, C324S209000
Reexamination Certificate
active
07093499
ABSTRACT:
A force sensor, or a method, determines a force using at least a measured inductance in a coil wherein a quantum tunneling composite is located in a magnetic path created by the coil, is positioned in a load path of the force, and is under strain from the force. A strain sensor, or a method, determines a strain using at least a measured inductance in a coil wherein a quantum tunneling composite is located in a magnetic path created by the coil, is positioned in a load path of a force, and is under strain from the force.
REFERENCES:
patent: 4920806 (1990-05-01), Obama et al.
patent: WO 98/33193 (1998-07-01), None
patent: WO 99/38173 (1999-07-01), None
patent: WO 00/79546 (2000-12-01), None
Delphi Technologies Inc.
Gray David M.
McBain Scott A.
Moorman Lori
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