X-ray or gamma ray systems or devices – Beam control
Reexamination Certificate
2007-01-31
2009-02-17
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Beam control
C378S019000
Reexamination Certificate
active
07492871
ABSTRACT:
A focus/detector system of an X-ray apparatus and a method for generating projective or tomographic phase contrast recordings, are disclosed. In an embodiment of the system, the system includes a beam source equipped with a focus and a focus-side source grating, arranged in the beam path and generates a field of ray-wise coherent X-rays, a grating/detector arrangement having a phase grating and grating lines arranged parallel to the source grating for generating an interference pattern, and a detector having a multiplicity of detector elements arranged flat for measuring the position-dependent radiation intensity behind the phase grating. Finally, the detector elements are formed by a multiplicity of elongate scintillation strips, which are aligned parallel to the grating lines of the phase grating and have a small period, whose integer multiple corresponds to the average large period of the interference pattern which is formed by the phase grating.
REFERENCES:
patent: 4031395 (1977-06-01), LeMay
patent: 5684851 (1997-11-01), Kurbatov et al.
patent: 5812629 (1998-09-01), Clauser
patent: 6262818 (2001-07-01), Cuche et al.
patent: 6713767 (2004-03-01), Wieczorek et al.
patent: 7180979 (2007-02-01), Momose
patent: 2002/0070365 (2002-06-01), Karellas
patent: 2005/0226376 (2005-10-01), Yun et al.
patent: 2007/0183581 (2007-08-01), Heismann et al.
patent: 2007/0183582 (2007-08-01), Baumann et al.
patent: 2007/0183583 (2007-08-01), Baumann et al.
patent: 26 11 706 (1977-02-01), None
patent: 197 50 337 (1998-06-01), None
patent: 101 21 018 (2002-10-01), None
patent: 10 2006 015 355.3 (2007-08-01), None
patent: 10 2006 015 356.1 (2007-08-01), None
patent: 10 2006 015 358.8 (2007-08-01), None
patent: 10 2006 017 290.6 (2007-08-01), None
patent: 10 2006 017 291.4 (2007-08-01), None
patent: 1 447 046 (2004-08-01), None
patent: 1 119 798 (2005-03-01), None
Weitkamp et al., “X-ray phase imaging with a grating interferometer”, Optics Express 2005, vol. 12, No. 16, pp. 6296-6304.
D. Vaughan (ed.), “X-Ray Data Booklet”, Lawrence Berkeley Laboratory, Berkley, 1986, pp. 2-28, 2-29.
U. Bonse and M. Hart, “An X-ray Interferometer”, Appl. Phys. Lett., 1965, vol. 6, No. 8, pp. 155-156.
Ingal and Bellaevskaya, “X-ray plane-wave topography observation of the phase contrast from a non-crystalline object”, J. Phys. D: Appl. Phys. 28, 1995, pp. 2314-2317.
R. Fitzgerald, “Phase-Sensitive X-Ray Interferometer”, Physics Today, 53, 2000, pp. 23-26.
Chapman et al., “Diffraction enhanced x-ray imaging”, Phys. Med. Biol. 42, 1997, pp. 2015-2025.
Wilkins et a., “Phase-contrast imaging using polychromatic hard X-rays”, Nature 384, 1996, pp. 335-338.
V. Lehmann, The Physics of Macropore Formation in low Doped n-Type Silicon, J. Electrochemical Soc. 140 (10), 1993, pp. 2836-2843.
Bergmann, Schäfer, “Lehrbuch der Experimentalphysik”, vol. 1, Mechanik, Akustik, Wärme, De Gruyter, Berlin, 1970, pp. 542-554.
Shack et al., J. Opt. Soc. Am. 61, 1971, p. 656.
Platt et al., “History and Principles of Shack-Hartmann Wavefront Sensing”, Journal of Refractive Surgery, vol. 17, 2001, pp. 573-577.
F. Roddier, “Variations on a Hartmann theme”, Opt. Eng. 29, 1990, pp. 1239-1242.
Primot et al., “Deconvolution from wave-front sensing: a new technique for compensating turbulence-degraded images”, J. Opt. Soc. Am. 7(9), 1990, pp. 1598-1608.
J. C. Wyant, “White Light Extended Source Shearing Interferometer”, Appl. Opt. 13, 1974, pp. 200-202.
C. L. Koliopoulos, “Radial grating lateral shear heterodyne interferometer”, Appl. Opt. 19, 1980, pp. 1523-1528.
J. Primot, L. Songo, “Achromatic three-wave (or more) lateral shearing interferometer”, J. Opt. Soc. Am. A, 12(12), 1995, pp. 2679-2685.
J. Primot, “Theoretical description of Shack-Hartmann wave-front sensor”, Optics Communications, 222, 2003, pp. 81-92.
V. Ronchi, “Forty Years of History of a Grating Interferometer”, Appl. Opt., 3(4), 1964, pp. 437-451.
Schroer et al., “Hard x-ray nanoprobe based on refractive x-ray lenses”, Appl. Phys. Lett. 87, 124103, 2005.
M. Bavdaz, N. Gurker, “Coded Imaging X-ray Microprobe”, X-Ray Spectrometry, 22, 1993, pp. 65-70.
Momose et al. “Tomographic image reconstruction using X-ray phase information”, SPIE, vol. 2708, pp. 674-684.
Barty et al., “Time-gated medical imaging with ultrafast laser plasma x-rays”, SPIE, vol. 2523, pp. 286-298.
C. J. Kotre, I. P. Birch, “Phase contrast enhancement of x-ray mammography: a design study”, Phys. Med. Biol., 44, 1999, pp. 2853-2866.
Arfelli et al, “Low-dose phase contrast x-ray medical imaging”, Phys. Med. Biol. 43, 1998, pp. 2845-2852.
Herrlin et al., “Contrast-Enhanced Radiography by Differential Absorption Using a Laser-Produced X-Ray Source”, Investigative Radiology 32, 1997, pp. 306-310.
Grätz et al., “Time-Gated Imaging in Radiology: Theoretical and Experimental Studies”, IEEE J. of selected Topics in Quantum Electronics, 2(4), 1996, pp. 1041-1048.
Murnane et al., “Ultrafast X-ray Pulses from Laser-Produced Plasmas”, Science, vol. 251, 1991, pp. 531-536.
Krol et al., “Laser-based microfocused x-ray source for mammography: Feasibiliy study”, Med. Phys. 24(5), 1997, pp. 725-732.
Piestrup et al., “A design of mammography units using a quasiminichromatic x-ray source”, Review of Scientific Instruments, 72(4), 2001, pp. 2159-2170.
C. G. Schroer, B. Lengler, “Focusing Hard X Rays to Nanometer Dimensions by Adiabatically Focusing Lenses”, Phys. Rev. Lett. 94, 054802, 2005.
Weitkamp et al.: X-ray phase imaging with a grating interferometer Optics Express, 2005, vol. 13, No. 16 p. 6296-6304.
Pfeiffer et al.: Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources Nature Physics, 2006, vol. 2 p. 258-261.
Senoussaoui et al.: Thin-film solar cells with periodic grating coupler Thin Solid Films, 2004, vol. 451-452 p. 397-401.
David Christian
Heismann Björn
Hempel Eckhard
Pfeiffer Franz
Popescu Stefan
Harness & Dickey & Pierce P.L.C.
Kiknadze Irakli
Siemens Aktiengesellschaft
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