Focal surface and detector for opto-electronic imaging...

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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C250S214100

Reexamination Certificate

active

06849843

ABSTRACT:
The focal surface for an opto-electronic imaging system includes an arrangement of detectors for image recording and a detector carrier or a FPA carrier for holding the detectors. The detectors are each made of at least one solid state element that is bonded to a flexible carrier substrate. The focal surface, or the detectors, respectively, exhibits a curvature, such that a curved field of view can be recorded. In a method for manufacturing a focal surface for opto-electronic imaging systems, at least one solid state element is bonded to a flexible carrier substrate to form flexible detectors, whereby a detector carrier provides a curvature and the flexible detectors are adapted to the curvature of the detector carrier. To manufacture a detector according to the present invention, a solid state element is thinned and bonded to a flexible carrier substrate, such that it is formed in a flexible manner and can be adapted to a curvature of a field of view. An opto-electronic imaging system according to the present invention with front optics for capturing an image and a detector arrangement that is arranged in a focal surface of the front optics, in which the detector arrangement is arranged in the focal surface in a curved manner.

REFERENCES:
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patent: 5991467 (1999-11-01), Kamiko
patent: 6285035 (2001-09-01), Taravade
patent: 6285400 (2001-09-01), Hokari
patent: 6486917 (2002-11-01), Iwasaki
patent: 35 34 187 (1994-06-01), None
patent: 195 32 119 (1997-03-01), None

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