Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1981-03-09
1983-06-14
Tokar, Michael J.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
G01R 3102
Patent
active
043885888
ABSTRACT:
Information about the plasma density profile in an aerodynamic flow field of plasma adjacent a supersonic space vehicle or test model is provided by a flush mountable plasma density profile probe device having at least three striplines embedded in and separated by a dielectric support member from a conducting ground plane therebelow. In operation, the device is affixed flush and conformally to the surface of the space vehicle or test model. The plasma density profile is determined from a plot of data points derived from sequential measurements, in the plasma flow field environment, of the conduction between a driven stripline and parallel flush embedded additional striplines in the order of the nearest stripline to the furtherest stripline from the driven stripline. Standard formulas can be applied to determine the data points.
REFERENCES:
patent: 3559056 (1971-01-01), Easi
patent: 3750013 (1973-07-01), Rotman et al.
patent: 3753102 (1973-08-01), Beck
patent: 4006404 (1977-02-01), Szuszczewicz et al.
Bredfeldt et al., Boundary Layer Ion Density Profiles as Measured by Elecstatic Probes, Jan. 1967, pp. 93-94, AIAA Journal.
Branning A. L.
O'Shea Kevin
Sciascia R. S.
The United States of America as represented by the Secretary of
Tokar Michael J.
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