X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1993-10-12
1995-05-23
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378 45, G01N 23223
Patent
active
054188261
ABSTRACT:
The present invention provides a fluorescent X-ray qualitative analytical method of determining elements in a sample by preliminarily measuring a standard peak position corresponding to an energy position of fluorescent rays generated from each element expected in a sample. The standard peak positions are then stored. The sample is then radiated with X-rays to cause fluorescent X-rays to be generated from the elements in the sample. Spectral data is obtained from the fluorescent X-rays to determine the peak-generating positions from the spectral data and then a comparison is made with the stored standard peak positions to determine the elements contained in the sample.
REFERENCES:
patent: 4429409 (1984-01-01), Berry et al.
patent: 4510573 (1985-04-01), Boyce et al.
patent: 5062127 (1991-10-01), Sayama et al.
Kira Akimichi
Sato Yoshimichi
Horiba Ltd.
Porta David P.
LandOfFree
Fluorescent X-ray qualitative analytical method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Fluorescent X-ray qualitative analytical method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fluorescent X-ray qualitative analytical method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2146231