Fluorescent X-ray qualitative analytical method

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378 45, G01N 23223

Patent

active

054188261

ABSTRACT:
The present invention provides a fluorescent X-ray qualitative analytical method of determining elements in a sample by preliminarily measuring a standard peak position corresponding to an energy position of fluorescent rays generated from each element expected in a sample. The standard peak positions are then stored. The sample is then radiated with X-rays to cause fluorescent X-rays to be generated from the elements in the sample. Spectral data is obtained from the fluorescent X-rays to determine the peak-generating positions from the spectral data and then a comparison is made with the stored standard peak positions to determine the elements contained in the sample.

REFERENCES:
patent: 4429409 (1984-01-01), Berry et al.
patent: 4510573 (1985-04-01), Boyce et al.
patent: 5062127 (1991-10-01), Sayama et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fluorescent X-ray qualitative analytical method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fluorescent X-ray qualitative analytical method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fluorescent X-ray qualitative analytical method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2146231

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.