Fluorescent X-ray film thickness gauge

X-ray or gamma ray systems or devices – Specific application – Fluorescence

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Details

378 89, 378206, G01N 2320, G21K 100

Patent

active

044060157

ABSTRACT:
A thickness measuring apparatus in which a shutter is horizontally interposed between an X-ray tube and the collimator defining the irradiated area of the test piece. While the X-ray beam is thus blocked, the area of the test piece which will be irradiated is viewable, via a mirror, thru a microscope. Typically, the device is used for measuring nickel plating on a copper base for which use it is equipped with a cobalt filter.

REFERENCES:
patent: 2455928 (1948-12-01), Hawks
patent: 3705305 (1972-12-01), Fischer
patent: 4178513 (1979-12-01), Dubois
patent: 4195229 (1980-03-01), Suzuki

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