X-ray or gamma ray systems or devices – Beam control – Window
Patent
1996-12-04
1998-04-14
Wong, Don
X-ray or gamma ray systems or devices
Beam control
Window
378 44, G21K 104
Patent
active
057402230
ABSTRACT:
A X-ray analyzer can generate an X-ray beam for application to a sample position during a support sample stage. An X-ray shield wall having an aperture transmissive to the X-ray beams is positioned adjacent to the supporting sample stage with a transparent film member sealingly extending across the aperture. An X-ray detector is positioned adjacent the X-ray shield wall. The upper side of the X-ray shield wall can be sealed and placed in a vacuum state or backfilled with a gas such as helium. The sample can be mounted at atmospheric pressure beneath the aperture and X-ray shield wall whereby improved transmission and detection of X-rays is achieved.
REFERENCES:
patent: 3889113 (1975-06-01), Rhodes
"Energy-dispersive x-ray spectrometry for multielement pollution analysis", by J.R. Rhodes, International Laboratory, Jul./Aug. 1973.
Hosokawa Yoshinori
Kashihara Kozo
Ozawa Sumito
Setou Gensiro
Horiba Ltd.
Wong Don
LandOfFree
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