X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate
1999-07-22
2001-09-25
Kim, Robert H. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Fluorescence
C378S045000, C378S050000
Reexamination Certificate
active
06295333
ABSTRACT:
FIELD OF THE INVENTION
The present invention relates generally to a fluorescent X-ray analyzer capable of carrying out non-destructive element analysis, and, more particularly, to a portable fluorescent X-ray analyzer having the capability of conducting element analysis of large samples, such as archaeological samples, and performing on-site analysis in criminal investigation.
BACKGROUND INFORMATION
Conventionally, portable type X-ray analyzers have been used for the purpose of analyzing large samples or for the purpose of on-site analysis by a fluorescent X-ray analyzing method, which has an excitation source consisting of a radio isotope or an X-ray tube. Also, small X-ray analyzers such as a desktop type analyzers have been installed on vehicles wherein a sample is cut to a small enough size to be put in a sample chamber and subjected to element analysis on the vehicle.
In the conventional portable type fluorescent X-ray analyzer, it is necessary to visually align an X-ray emission port to a sample to be measured upon adjusting a relative position of a housing and a sample to be measured to specify a measuring point to which a fluorescent X-ray was irradiated. Due to this, it has been difficult to perform exact positional alignment because a point to be measured to which an X-ray is irradiated is hidden by the housing and can not be observed.
In particular, when an X-ray is irradiated onto a sample to be measured having a diameter of 10 mm or less using a collimator to restrict an X-ray light flux, positional alignment is almost impossible. The relative position of the housing and the sample to be measured are deviated by a slight amount to conduct measurements at a plurality of points and a film thickness/composition of the sample to be measured is detected, thus requiring great labor and time.
Meanwhile, in more recent years there has been an instrument in which an expensive fiver scope is attached to a housing wherein the housing mounted on a tripod is moved through a two-axis stage to effect alignment while observing the sample to be measured. There has, however, been a problem in that the entire system becomes large and heavy, thus sacrificing portability and becoming expensive.
SUMMARY OF THE INVENTION
In order to solve the above problem, a first aspect of the present invention is characterized by accommodating in a single housing an imaging device for observing a position where a primary X-ray generated by an X-ray generating source is irradiated onto a sample to be measured, and a display device for displaying an image thereof.
A second aspect of the present invention is characterized by a display, formed by superimposition or overlapping, of an X-ray spectrum at the measuring point and provided on a display device for displaying an image of the sample to measured and including a measuring point thereof.
A third aspect of the present invention is characterized in that a memory device is provided in the housing, and is further characterized in that sample images as positional information at the measuring point and corresponding X-ray spectra can be stored as a set.
By the above-described structure, in accordance with the first aspect of the invention an image of the sample to be measured is obtained by the imaging device and displayed on the display device. Accordingly, the analyzer can conduct positioning of the sample by moving either the housing or the sample, or both, to change the relative position therebetween while observing an image of the sample displayed on the display device.
In accordance with the second aspect of the present invention, because an X-ray spectrum of the sample to be measured at the measuring point obtained by the X-ray detector is displayed at the same time on the display device on which an image of the sample to be measured is displayed, it becomes quite obvious at which position sample measurement was made with an X-ray spectrum. Also, by taking a photofilm of the display device, it becomes possible to leave the image of the sample to be measured and the X-ray spectrum of the sample to be measured at the measuring point together in the image.
In accordance with the third aspect of the invention, storage in a memory device is provided for storing the image of the sample to be measured and the X-ray spectrum obtained from the sample and for the storage of the X-ray spectrum obtained from the sample as one set and for the storage of a plurality of such sets of information. Accordingly, better data control in this case is facilitated as compared to data control in the case of a single image or a single X-ray spectrum. Further, it is possible to prevent mistakes in comparing between image data and an X-ray spectrum.
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B. D. Cullity. Elements of X-Ray Diffraction, second edition (Reading, MA: Addison-Wesley, 1978), p. 444-446.
Adams & Wilks
Ho Allen C.
Kim Robert H.
Seiko Instruments Inc.
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