X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate
2007-01-30
2007-01-30
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Fluorescence
C209S589000
Reexamination Certificate
active
11197303
ABSTRACT:
The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.
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WO 03/087215 A1, Composition of Materials Containing Recycled Plastics, Brian Riise et al., World Intellectual Property Organization, International Publication Date Oct. 23, 2003.
Hisazumi Takao
Iwamoto Hiroshi
Iwata Yukihiro
Sakaguchi Etsuyoshi
Tani Yoshiyuki
Corbett John M.
Glick Edward J.
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