X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate
2007-05-24
2008-09-09
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Fluorescence
C378S208000
Reexamination Certificate
active
07424093
ABSTRACT:
To provide a fluorescent X-ray analysis apparatus, whereby a peak-back ratio is improved by effectively exciting a focused element and a detection limit of the focused element is improved by decreasing a scattered X-ray to be a background. A sample housing has one or more wall surfaces made of a material through which an X-ray transmits and an X-ray source is arranged so that a primary X-ray is irradiated on the wall surface. In addition, the sample housing is arranged so that a wall surface different from a wall surface on which the primary X-ray is irradiated is opposed to an X-ray detector incident window. Further, the primary X-ray from the X-ray source is arranged so as to be able to irradiate the wall surface of the sample housing to which the X-ray detector incident window is opposed. The sample housing has a shape extending in response to extension of a viewing filed that a detection element in the X-ray detector is seen from the X-ray detector incident window. In addition, on the wall of the sample housing, a metal for secondarily exciting the focused element is arranged on an area other than an area through which the primary X-ray transmits and an area where the fluorescent X-ray from the focused element passes to the detector.
REFERENCES:
patent: 2002/0101957 (2002-08-01), Feng
patent: 2004/0141585 (2004-07-01), Proctor
patent: 2007/0269004 (2007-11-01), Matoba et al.
patent: 2008/0013681 (2008-01-01), Fukai et al.
patent: 2004-150990 (2004-05-01), None
Fukai Takayuki
Matoba Yoshiki
Takahashi Masanori
Brinks Hofer Gilson & Lione
SII NanoTechnology Inc.
Song Hoon
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