Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-03-31
2010-11-02
Mariam, Daniel G (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S218000
Reexamination Certificate
active
07826653
ABSTRACT:
A fluid measurement system includes a long focus optical system at a CCD camera, and an image processor for comparing particle images taken at two time points for analysis. The long focus optical system is provided with a shield which shields a part including a central portion of a main mirror at an arbitrary shield rate. As a result, the particle image of a tracer is enlarged with its contour kept clear, that is, in focus, and therefore, the image having a luminance which allows analysis by the PIV method can be taken in spite of use of the long focus optical system.
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Mori Michitsugu
Tezuka Hideaki
Mariam Daniel G
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
The Tokyo Electric Power Company Incorporated
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