Optics: measuring and testing – By light interference – For refractive indexing
Reexamination Certificate
2006-06-15
2008-07-22
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
For refractive indexing
C356S436000, C422S082090
Reexamination Certificate
active
07403292
ABSTRACT:
A fluid analysis element includes: a semi transmissive/semi reflective first reflector; a transmissive apertured member, having a plurality of apertures, with diameters sufficiently smaller than the wavelength of measuring light, formed therein for holding a fluid sample; and a second reflector, which is fully reflective or semi transmissive/semi reflective. The first reflector, the transmissive apertured member, and the second reflector are provided in this order from the side of the element into which the measuring light enters. Emitted light is emitted from the first reflector or the second reflector. The element displays absorption properties that absorb light of specific wavelengths according to the mean complex refractive indices of the first and second reflectors, and the mean complex refractive index and the thickness of the transmissive apertured member. Analysis of the fluid sample is performed by detecting physical properties or changes in physical properties that occur according to the absorption properties.
REFERENCES:
patent: 2006/0281018 (2006-12-01), Tomaru
patent: 2007/0008467 (2007-01-01), Tomaru
patent: 2007/0263221 (2007-11-01), Naya et al.
patent: 2001-174719 (2001-06-01), None
patent: WO 2002/082042 (2002-10-01), None
Connolly Patrick J
FUJIFILM Corporation
Sughrue & Mion, PLLC
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