Measuring and testing – Volume or rate of flow – With indirect temperature or density compensation
Patent
1983-04-28
1985-04-09
Ruehl, Charles A.
Measuring and testing
Volume or rate of flow
With indirect temperature or density compensation
7386106, 7386104, G01F 174, G01F 186
Patent
active
045093660
ABSTRACT:
A mass flow rate measuring apparatus includes a pair of velocity detecting electrodes spaced by a portion of a wider density detection electrode so as to eliminate any mutual interference between the velocity detecting electrodes. A temperature compensation circuit is used to compensate for errors in the density measurement otherwise caused by the temperature characteristic of the flow pipe and the carrier medium.
REFERENCES:
patent: 3595078 (1971-07-01), Beck
Doi Yuji
Matsushita Shigetada
Fuji Electric & Co., Ltd.
Nippon Steel Corporation
Ruehl Charles A.
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