Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-03-21
2006-03-21
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S060000, C702S065000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07016794
ABSTRACT:
A method for analyzing electromigration and voltage drop effects in wire segments forming a power-bus grid of an integrated circuit. A floor plan design is created by mapping wire segments to various metal layers in the IC core. Digital, analog, and memory power zones indicating the power consumption of regions within the core are also mapped to the core. An equivalent circuit of the floor plan is generated in a netlist. The netlist is simulated, with the current density and voltage drop of power-bus wire segments calculated. Calculated current density and voltage drop values are analyzed in the floor plan design using a color map to indicate the current density and voltage drop levels of the wire segments. The designer can modify the floor plan design quickly and easily if the calculated current density and voltage drop values indicate potential electromigration or voltage drop problems.
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Deep Sub-micron Design Issues for a Multi-Million Transistor Microprocessor; DesignCon Conference, Jan., 1998; pp. 344-348.
Christopher P. Maiorana P.C.
Hoff Marc S.
West Jeffrey R
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