Floating head probe

Geometrical instruments – Gauge – Continuous gauging

Patent

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Details

33517, 33551, 33558, G01B 300

Patent

active

052070050

ABSTRACT:
A probe for inspecting contoured surfaces by transmitting and receiving eddy currents includes a shaft disposed in spatial relationship with the contoured surface and a pivotal probe manipulator rotatably mounted on the end of the shaft and having a critical dimension including the location of the pivot point and the width of the probe manipulator and spring means urging the probe manipulator against the contoured surface so that the probe travels along the surface and rotates substantially .+-.90 degrees relative to the shaft.

REFERENCES:
patent: 2990617 (1961-07-01), Mustonen
patent: 3068581 (1962-12-01), Skalwold et al.
patent: 3166852 (1965-01-01), Whitney
patent: 3816932 (1974-06-01), Legille
patent: 4571848 (1986-02-01), Krutz et al.
patent: 4976043 (1990-12-01), Bieg
Western Electric Tech. Oct. 1973 Probe Assembly.

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