Geometrical instruments – Gauge – Continuous gauging
Patent
1992-07-20
1993-05-04
Cuchlinski, Jr., William A.
Geometrical instruments
Gauge
Continuous gauging
33517, 33551, 33558, G01B 300
Patent
active
052070050
ABSTRACT:
A probe for inspecting contoured surfaces by transmitting and receiving eddy currents includes a shaft disposed in spatial relationship with the contoured surface and a pivotal probe manipulator rotatably mounted on the end of the shaft and having a critical dimension including the location of the pivot point and the width of the probe manipulator and spring means urging the probe manipulator against the contoured surface so that the probe travels along the surface and rotates substantially .+-.90 degrees relative to the shaft.
REFERENCES:
patent: 2990617 (1961-07-01), Mustonen
patent: 3068581 (1962-12-01), Skalwold et al.
patent: 3166852 (1965-01-01), Whitney
patent: 3816932 (1974-06-01), Legille
patent: 4571848 (1986-02-01), Krutz et al.
patent: 4976043 (1990-12-01), Bieg
Western Electric Tech. Oct. 1973 Probe Assembly.
Amos Jay M.
Raulerson David A.
Cuchlinski Jr. William A.
Friedland Norman
United Technologies Corporation
Wirthlin Alvin
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