Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-12-08
2008-10-07
Tran, Andrew Q (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185260, C365S185270, C257S350000, C257S347000
Reexamination Certificate
active
07433234
ABSTRACT:
A semiconductor storage device including a memory cell. In the memory cell a buried electrode is formed on a semiconductor substrate. A semiconductor layer is formed on the buried electrode via a buried insulating film. A surface electrode is formed on the semiconductor layer via an insulating film. A source region and drain region are formed in the semiconductor layer on both sides of the surface electrode with a predetermined spacing therebetween. A floating body is formed between the source region and drain region, which stores data in accordance with whether holes are stored in the floating body. The buried electrode serves as a gate electrode, and the surface electrode serves as a plate electrode.
REFERENCES:
patent: 4954991 (1990-09-01), Saeki et al.
patent: 5050124 (1991-09-01), Saeki et al.
patent: 5447884 (1995-09-01), Fahey et al.
patent: 6377489 (2002-04-01), Kim et al.
patent: 6621725 (2003-09-01), Ohsawa
patent: 7088623 (2006-08-01), Huang
patent: 2007/0230234 (2007-10-01), Ohsawa
patent: 2007/0242526 (2007-10-01), Morikado et al.
patent: 6-216329 (1994-08-01), None
patent: 2006-164447 (2006-06-01), None
patent: 2007-287975 (2007-11-01), None
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tran Andrew Q
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