Flip chip interconnected structure and a fabrication method...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

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Reexamination Certificate

active

06624004

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of Invention
The present invention relates generally to a flip chip interconnected structure and a fabrication method thereof. More particularly, the present invention relates to an improved flip chip interconnected structure having good electrical connection and a fabrication method thereof.
2. Description of the Related Art
With the increasing need for high-density devices for use in lightweight, portable electronics, there has been a gradual shift in sizes of integrated circuits and their package configurations. This gradual shift has resulted in developing various techniques for different package types.
A flip chip interconnected technology utilizes solder bumps on bonding pads of a chip to electrically connect to a substrate. Comparing the flip chip interconnected method to a wire bonding method and a tape automatic bonding method, the circular path of the flip chip interconnected package is shorter and the electrical properties are better. The bumps are arranged in a matrix shape; thus, the amount of pin outs of the chip is significantly increased. Since the flip chip technique is faster, denser, thinner, lighter and provides a low cost package, one can expect the flip chip technique to replace wire bonding.
FIGS. 1 and 2
illustrate schematic views of a conventional flip chip package. Referring to
FIG. 1
, a chip
110
has an active surface
112
, and a plurality of bonding pads
114
are arranged on the active surface
112
. A plurality of bumps
116
are formed on the bonding pads
114
of the chip
110
. A substrate
120
has a surface
122
, and a plurality of nodes
124
are formed on the surface
122
. A position of each node
124
corresponds to a position of each bump
116
. A stencil printing process is carried out to apply solder paste onto the substrate
120
. A plurality of solder structures
130
are formed on the nodes
124
of the substrate
120
. Referring to
FIGS. 1 and 2
, a bonding process is performed to bond the chip
110
to the substrate
120
. The bumps
116
of the chip
110
are bonded to the solder structures
130
of the substrate
120
in a reflow oven. A reflow method allows the bumps
116
to combine with the solder structures
130
to form a plurality of solder balls
140
. The chip
110
is electrically connected to the substrate
120
by the solder balls
140
.
Referring to
FIG. 2
, a filling process is carried out to fill a gap between the chip
110
and the substrate
120
with a molding compound
150
, and the molding compound
150
encapsulates the solder balls
140
.
However, in the reflow process, the substrate
120
will bend due to the heating in the reflow process. The distance between the chip
110
and the substrate
120
at a center region is closer due to the bending effect, and the distance between the chip
110
and the substrate
120
at the end regions is greater. Stress caused by the bending effect can affect the bonding between the chip
110
and the substrate
120
. The solder balls
140
will easily detach from the nodes
124
, and the stress due to the bending can also affect the reliability of the device. Thus the electrical connection and the reliability of the product are affected.
A conventional method utilizes a clamp (not shown) to hold the chip
110
and pre-heat the chip
110
for a while during a bonding process. Once the heat is transferred to the bumps
116
, the bumps
116
will combine with the solder structures
130
to form the solder balls
140
. Thus the chip
110
is electrically connected to the substrate
120
. Although this method can prevent the substrate from bending, the pre-heating process on the chip
110
can damage the chip
110
because the chip is pre-heated for about 20 to 30 seconds at a temperature of about 200°. The conventional method complicates the fabrication process and the quality of the product is not reliable.
SUMMARY OF THE INVENTION
To achieve the foregoing and other objects and in accordance with the purpose of the present invention, the present invention provides a flip chip interconnected structure comprising a substrate having a surface, a chip locating region and a plurality of nodes. The chip locating region is on the surface of the substrate and the nodes are formed on the chip locating region. A chip is provided and has an active surface, on which a plurality of bonding pads are formed. The active surface of the chip corresponds to the surface of the substrate. A plurality of solder balls are respectively connected to the bonding pads and the nodes, wherein sizes of the solder balls are varied to allow the chip to bond to the chip locating region of the substrate. A molding compound is filled in between the chip and the substrate and is used to encapsulate the solder balls. The solder balls are arranged in a matrix, and sizes of the solder balls located at a center region of the chip locating region are smaller than sizes of the solder balls located at a peripheral region of the chip locating region.
It is another object of the present invention to provide a flip chip interconnected structure comprising a chip that has an active surface on which a plurality of bonding pads are formed. A substrate also is provided and has a surface, a chip locating region and a plurality of nodes. The chip locating region is on the surface of the substrate and the nodes are formed on the chip locating region. The chip locating region further comprises solder mask openings, and the nodes are exposed by the solder mask openings. Sizes of the solder mask openings are varied. A plurality of solder balls are respectively connected to the bonding pads and the nodes. The chip is bonded to the chip locating region of the substrate by the solder balls. The active surface of the chip corresponds to the surface of the substrate. A molding compound is filled in between the chip and the substrate and is used to encapsulate the solder balls. The solder mask openings are arranged in a matrix, and sizes of the solder mask openings located at a center region of the chip locating region are larger than sizes of the solder mask openings located at a peripheral region of the chip locating region.
It is another object of the present invention to provide a method of fabricating a flip chip interconnected structure. The steps of the method comprise first providing a chip that has an active surface. A plurality of bonding pads are formed on the active surface, and a plurality of bumps are formed on the bonding pads. A substrate is provided, which has a surface and a chip locating region. The chip locating region is on the surface of the substrate, and a plurality of nodes are formed on the chip locating region. Solder paste is used to cover the chip locating region and the nodes. The solder paste forms a plurality of solder structures with various sizes. A bonding process is performed to bond the active surface of the chip to the surface of the substrate by bonding the bumps to the solder structures. A heating process is carried out to combine the bumps and solder structures to form a plurality of solder balls. The solder balls are bonded respectively to the bonding pads and the nodes. The chip is bonded to the chip locating region of the substrate through the solder balls. A stencil printing board has a plurality of openings. The stencil printing board is located on the substrate and the nodes are exposed by the openings. The openings are filled with the solder paste by a screen printing method. Positions of the solder paste correspond to positions of the nodes. The solder paste forms solder structures with various sizes because the sizes of the openings are different. The openings are arranged in a matrix, and sizes of the openings located at a peripheral region of the stencil printing board are larger than sizes of the openings near a center region of the stencil printing board. Therefore, the amount of solder paste filled in the opening at the peripheral region is more than the amount of solder paste filled in the openings at the center region.
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