Flip chip and wire bond semiconductor package

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings

Reexamination Certificate

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Details

C257S774000, C257S778000, C257S782000, C257S784000, C257SE25013

Reexamination Certificate

active

07554185

ABSTRACT:
A semiconductor package and method of forming the package, including a substrate having an opening formed therein. Contact pads are formed about a periphery of the opening on a first side of the substrate and a second opposing side of the substrate. A flip chip die is mounted to the substrate, having an active side mounted on a first side of the substrate and in electrical communication with at least some of the contact pads formed on the first side of the substrate. At least one wire bond die is mounted through the opening, with a non-active side mounted on the active side of the flip chip die. The wire bond die is in electrical communication with at least some of the plurality of contact pads formed on the second opposing side of the substrate.

REFERENCES:
patent: 5541450 (1996-07-01), Jones et al.
patent: 5608262 (1997-03-01), Degani et al.
patent: 6249052 (2001-06-01), Lin
patent: 6407456 (2002-06-01), Ball
patent: 6426559 (2002-07-01), Bryan et al.
patent: 6437447 (2002-08-01), Huang et al.
patent: 6590281 (2003-07-01), Wu et al.
patent: 6815829 (2004-11-01), Shibata
patent: 2003/0053297 (2003-03-01), Gaynes et al.
patent: 2004/0212068 (2004-10-01), Wang
patent: 2004/0217485 (2004-11-01), Chung
patent: 2004/0251531 (2004-12-01), Yang et al.

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