Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-08-09
2005-08-09
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S601000, C455S067150, C702S085000
Reexamination Certificate
active
06928373
ABSTRACT:
Methods, systems and computer program products for efficiently characterizing devices under test (DUTs) using a vector network analyzer (VNA) are provided. A N-port DUT can be divided as appropriate into multiple sub-devices, or multiple separate devices can be present. A parent calibration is performed. The VNA is then used to determine the S-parameters of interest for each sub-device or separate device, preferably without measuring S-parameters that are not of interest. This can include measuring S-parameters and removing corresponding error coefficients determined during the parent calibration.
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Ho Rena
Martens Jon S.
Tu Jamie
Anritsu Company
Le John H.
Nghiem Michael
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