Flexible tester surface for testing integrated circuits

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 725, 324158P, 437 8, G01R 104, G01R 1067

Patent

active

049947354

ABSTRACT:
The individual transistor or logic unit testing is accomplished by a specially fabricated flexible tester surface made in one embodiment of several layers of flexible silcon dioxide, each layer containing vias and conductive traces leading to thousands of microscopic metal probe points on one side of the test surface. The probe points electrically contact the contacts on the wafer under test by fluid pressure. The tester surface traces are then connected, by means of multiplexers, to a conventional tester signal processor.

REFERENCES:
patent: 3596228 (1971-07-01), Reed, Jr.
patent: 4065717 (1977-12-01), Kattner et al.
patent: 4574235 (1986-03-01), Kelly et al.
patent: 4636722 (1987-01-01), Ardezzone
patent: 4647851 (1987-03-01), Dugan
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4686112 (1987-08-01), Hoffman
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4707657 (1987-11-01), Bolgh-Petersen
patent: 4814283 (1989-03-01), Temple et al.
patent: 4820976 (1989-04-01), Brown
patent: 4853627 (1989-08-01), Gleason et al.
patent: 4891585 (1990-01-01), Janko et al.
"Plastics That Conduct Electricity", by Kaner et al, Scientific American, 2/88, pp. 106-111.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Flexible tester surface for testing integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Flexible tester surface for testing integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flexible tester surface for testing integrated circuits will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1146168

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.