Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1989-11-14
1991-02-19
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 725, 324158P, 437 8, G01R 104, G01R 1067
Patent
active
049947354
ABSTRACT:
The individual transistor or logic unit testing is accomplished by a specially fabricated flexible tester surface made in one embodiment of several layers of flexible silcon dioxide, each layer containing vias and conductive traces leading to thousands of microscopic metal probe points on one side of the test surface. The probe points electrically contact the contacts on the wafer under test by fluid pressure. The tester surface traces are then connected, by means of multiplexers, to a conventional tester signal processor.
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"Plastics That Conduct Electricity", by Kaner et al, Scientific American, 2/88, pp. 106-111.
Burns William J.
Eisenzopf Reinhard J.
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