Flexible multi-layered probe for measuring a signal from an...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S072500

Reexamination Certificate

active

06930497

ABSTRACT:
A flexible probe, applicable for measuring signals from the object with an uneven surface, includes at least a probe tip, a flexible multi-layered dielectric substrate, a planar transmission structure and a coaxial transmission structure. The probe tip is connected to the planar transmission structure and extends beyond the flexible dielectric substrate. The planar transmission structure is attached to and supported by the flexible dielectric substrate and then connected to the coaxial transmission structure.

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“Rugged Probe Design Delivers MIC Measurements”, Markuu Jenu/ Microwaves & RF/ Jenu/ Microwaves & RF / Jun. 1996/ p. 104-106.
“Kapton”

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