Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-16
2005-08-16
Hollington, Jermele M. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S072500
Reexamination Certificate
active
06930497
ABSTRACT:
A flexible probe, applicable for measuring signals from the object with an uneven surface, includes at least a probe tip, a flexible multi-layered dielectric substrate, a planar transmission structure and a coaxial transmission structure. The probe tip is connected to the planar transmission structure and extends beyond the flexible dielectric substrate. The planar transmission structure is attached to and supported by the flexible dielectric substrate and then connected to the coaxial transmission structure.
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“Rugged Probe Design Delivers MIC Measurements”, Markuu Jenu/ Microwaves & RF/ Jenu/ Microwaves & RF / Jun. 1996/ p. 104-106.
“Kapton”
Deng Joseph D. S.
Lee Hong-Chyi
Chung Shan Institute of Science and Technology Armaments Bureau,
Hollington Jermele M.
J.C Patents
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