Flexible array probe for the inspection of a contoured...

Details Flexible array probe for the inspection of a contoured... Flexible array probe for the inspection of a contoured...

2008-05-20

2011-11-01

Aurora, Reena (Department: 2858)

Electricity: measuring and testing

Magnetic

Hysteresis or eddy current loss testing

C324S228000, C324S238000, C324S244000

Reexamination Certificate

active

08049494

ABSTRACT:
A flexible array probe is disclosed suitable for use in the non-destructive testing and inspection of test pieces with varying cross-sectional geometries. Array elements—such as, but not limited to, eddy current sensors, piezoelectric sensor elements, and magnetic flux leakage sensors—are mounted on thin alignment fins and coupled together with pairs of pivot mechanisms along the axis of desired rotation. The pivot mechanisms allow rotation in exactly one dimension and force the flexible array probe to align its elements orthogonally to the surface of the structure under test. Alignment and coupling fixtures are also disclosed.

REFERENCES:
patent: 4543528 (1985-09-01), Baraona
Office Action issued by the Chinese Patent Office on Aug. 5, 2010 in connection with corresponding Chinese Patent Application No. 200810127736.X.
English translation of Chinese Office Action issued in connection with Chinese Patent Application No. 200810127736.X on Aug. 5, 2010.

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