Flaw detector

Details Flaw detector Flaw detector

2006-03-21

2006-03-21

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Electrolyte properties

Using a conductivity determining device

Reexamination Certificate

active

07015700

ABSTRACT:
Flaw detection apparatus includes an electrode disposed in a region surrounded by a packaging material including a layer of an electrically-conductive material; a cutting member made of an electrically-conductive material and adapted to cut a predetermined portion of the packaging material; a variable detector, disposed between the electrode and the cutting member, for detecting an electrical variable; and flaw detection processor for reading the detected variable and for determining, on the basis of the detected variable, a flaw in the packaging material. In this case, the variable detector is disposed between the electrode and the cutting member.

REFERENCES:
patent: 4125805 (1978-11-01), Nagamatsu et al.
patent: 4243932 (1981-01-01), Kakumoto et al.
patent: 4291600 (1981-09-01), Kawaguchi et al.
patent: 5760295 (1998-06-01), Yasumoto

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