Flaw detector

Details Flaw detector Flaw detector

1982-05-06

1984-12-18

Scherbel, David A.

Classifying, separating, and assorting solids

Sorting special items, and certain methods and apparatus for...

Sorting bottles, ampoules, jars, drinking vessels, or like...

250223B, 356240, 356428, 358106, 364507, B07C 534, G01N 2190, H04N 702

Patent

active

044886489

ABSTRACT:
Container flaws are detected by repetitively sampling the output of a photosensor at a controlled rate dependent on the speed of inspection. Samples are digitized and stored in memory on a first in, first out basis. First in (oldest) and last in (newest) samples are used to provide a sliding computation of the slope or rate of change of the photosensor output. The computed slope is compared to an empirically determined preselected number. Containers are rejected or accepted based on the results of the comparison.

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patent: 4292672 (1981-09-01), Southgate
patent: 4364113 (1982-12-01), Sengebusch et al.
patent: 4376951 (1983-03-01), Miyazawa
patent: 4378494 (1983-03-01), Miller
patent: 4390782 (1983-06-01), Vornfett

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