Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
Patent
1987-01-14
1988-01-05
Abrams, Neil
Electrical connectors
Preformed panel circuit arrangement, e.g., pcb, icm, dip,...
With provision to conduct electricity from panel circuit to...
439330, 439525, H01R 2372, H01R 13627
Patent
active
047173475
ABSTRACT:
A burn-in test socket for use with flatpack semiconductor components is disclosed. The flatpack burn-in socket is especially adapted for use with robotic assembly techniques. The socket comprises an insulative housing with a plurality of terminals adapted to be in registry with leads on a flatpack semiconductor device located in a conventional flatpack carrier. The terminals are doubly reversely formed to laterally wipe the leads during insertion. Electrical continuity of the socket terminals and dynamic electrical testing of the semiconductor device can be probed from above the socket.
REFERENCES:
patent: 3393396 (1968-07-01), Majewski
patent: 3892312 (1975-07-01), Tems
patent: 4176895 (1979-12-01), Aldridge
patent: 4236777 (1980-12-01), Merline et al.
patent: 4427249 (1984-01-01), Bright et al.
patent: 4542949 (1985-09-01), Tewes et al.
"Soft Touch" Flat-Pack Sockets, (3M Brochure No. TD-2608, 3-81).
Welcon Burn-In Test Contactors, (Wells Electronics Inc. Brochure).
Angeleri Angelo V.
Babow David A.
Doench Thomas K.
Abrams Neil
AMP Incorporated
Groen Eric J.
Pitts Robert W.
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