Flatness and throughput of single side polishing of wafers

Abrading – Abrading process – Glass or stone abrading

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

451291, B24B 100

Patent

active

060800429

ABSTRACT:
A wafer polishing apparatus includes one or more wafer carriers each containing one or more wafers mounted on both sides of the carrier. Upper and lower turntables having upper and lower polishing surfaces, rotate to polish the wafers attached to the carriers. Hence, wafers on the top of the carriers, and wafers on the bottom of the carriers are polished simultaneously. This configuration increases throughput; also, thermal deformations in the wafers are reduced, thus improving flatness.

REFERENCES:
patent: 3813828 (1974-06-01), Bennett
patent: 5191738 (1993-03-01), Nakazato et al.
patent: 5245790 (1993-09-01), Jerbic
patent: 5314843 (1994-05-01), Yu et al.
patent: 5320706 (1994-06-01), Blackwell
patent: 5352625 (1994-10-01), Hoshi
patent: 5362669 (1994-11-01), Boyd et al.
patent: 5377451 (1995-01-01), Leoni et al.
patent: 5421769 (1995-06-01), Schultz et al.
patent: 5424224 (1995-06-01), Allen et al.
patent: 5429711 (1995-07-01), Watanabe et al.
patent: 5486129 (1996-01-01), Sandhu et al.
patent: 5494857 (1996-02-01), Cooperman et al.
patent: 5697832 (1997-12-01), Greenlaw
patent: 5782678 (1998-07-01), Cesna et al.
patent: 5897425 (1999-04-01), Fisher, Jr. et al.
Cawley, Measuring Crystal Plate Thickness in a Lapping Operation, Western Electric, pp. 7-8, Jul. 1981.
Nordyke, Disk Substrate Polisher, IBM Technical Disclosure Bulletin, vol. 26, pp. 1652-1654, Aug. 1983.
Web Page for Zygo, http://www.zygo.com/semicon/semicon.htm, entitled Semiconductor Manufacturing, 3pgs., Sep 11, 1996.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Flatness and throughput of single side polishing of wafers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Flatness and throughput of single side polishing of wafers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flatness and throughput of single side polishing of wafers will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1779716

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.