Flat plate FAIMS with lateral ion focusing

Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S287000, C250S281000, C250S282000

Reexamination Certificate

active

07851745

ABSTRACT:
A high field asymmetric waveform ion mobility spectrometer (FAIMS) includes at least two focusing electrodes that are separated one from the other by a gap, which decreases in width along a direction of ion flow. Within the gap is disposed an electrode assembly including a first electrode and a second electrode, approximately flat surfaces of the first and second electrodes facing one another so as to define a space of approximately uniform thicknesses therebetween. During use electrical signals are applied via an electrical contact on at least one of the first electrode and the second electrode, and on each one of the at least two focusing electrodes. The electrical signals are for establishing electrode electric field conditions within the space between the first electrode and the second, for selectively transmitting ions therethrough and for directing the selectively transmitted ions in a direction away from one of the at least two focusing electrodes and toward a central portion of the space.

REFERENCES:
patent: 6495823 (2002-12-01), Miller et al.
patent: 7399959 (2008-07-01), Miller et al.
patent: 7550717 (2009-06-01), Belford et al.
patent: 2003/0057367 (2003-03-01), Guevremont et al.
patent: 2004/0135080 (2004-07-01), Ouyang et al.
patent: 2009/0206250 (2009-08-01), Wollnik
patent: WO 01/69216 (2001-09-01), None
patent: WO 2007/136373 (2007-11-01), None
patent: WO 2008/067331 (2008-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Flat plate FAIMS with lateral ion focusing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Flat plate FAIMS with lateral ion focusing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flat plate FAIMS with lateral ion focusing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4238838

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.