Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system
Reexamination Certificate
2008-02-29
2010-10-12
Porta, David P (Department: 2884)
Radiant energy
Invisible radiant energy responsive electric signalling
Semiconductor system
Reexamination Certificate
active
07812314
ABSTRACT:
An x-ray detector is disclosed that has had all unnecessary material removed from the x-ray beam path, and all of the remaining material in the beam path made as light and as low in atomic number as possible. The resulting detector is essentially transparent to x-rays and, thus, has greatly reduced internal scatter. The result of this is that x-ray attenuation data measured for the object under examination are much more accurate and have an increased dynamic range. The benefits of this improvement are that beam hardening corrections can be made accurately, that computed tomography reconstructions can be used for quantitative determination of material properties including density and atomic number, and that lower exposures may be possible as a result of the increased dynamic range.
REFERENCES:
patent: 2810837 (1957-10-01), Kizaur
patent: 5282236 (1994-01-01), Hayes et al.
patent: 6256367 (2001-07-01), Vartanian
patent: 6618466 (2003-09-01), Ning
patent: 6744852 (2004-06-01), Klotz et al.
patent: 7065234 (2006-06-01), Du et al.
patent: 7286636 (2007-10-01), Unger et al.
patent: 2004/0251438 (2004-12-01), Iwakiri
patent: 2006/0171507 (2006-08-01), Watanabe et al.
patent: 2007/0085015 (2007-04-01), Castleberry
patent: 2007/0165785 (2007-07-01), Watanabe et al.
patent: 2007/0272873 (2007-11-01), Jadrich et al.
patent: 2008/0078939 (2008-04-01), Hennessy et al.
patent: 2008/0078940 (2008-04-01), Castleberry et al.
patent: 2008/0304246 (2008-12-01), Utschig et al.
Wittenau, “Edge-Spread functions Expected for several Changes in a Commercial Flat-Panel System”, LLNL report UCRL-ID-147751. dated Feb. 25, 2002, Livermore, California, USA.
Aufderheide et al., “Concluding Report: Quantitative Tomography Simulations and Reconstruction Algorithms”, Appendix 1, LLNL report UCRL-ID-146938, dated Feb. 1, 2002, Livermore, California, USA.
LANL Licensable Technolgies Announcement LA-UR-06-1463. “Flat Panel X-Ray Detector with Improved Attenuation Accuracy and Dynamic Range”, 2006, Los Alamos, New Mexico, USA, details of invention were not disclosed.
Smith et al., American society of Nondestructive Testing Conference, Nov. 12-16, 2007, Las Vegas, Nevada, USA, abstract for oral presentation that described problem solved by the subject invention, but did not disclose invention.
Smith et al., American society of Nondestructive Testing Conference, Nov. 12-16, 2007, Las Vegas, Nevada, USA, Powerpoint slides for oral presentation that described problem solved by the subject invention, but did not disclose invention. No hardcopies of presentation provided published or distributed to attendees.
Berry Phillip C.
Claytor Thomas N.
Hills Charles R.
Smith Peter D.
Durkis James C.
Malevic Djura
O'Dwyer Thomas S.
Porta David P
The United Sttes of America as represented by the United States
LandOfFree
Flat panel X-ray detector with reduced internal scattering... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Flat panel X-ray detector with reduced internal scattering..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flat panel X-ray detector with reduced internal scattering... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4194585