Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2004-06-28
2009-12-29
Nguyen, Chanh (Department: 2629)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C349S064000, C345S904000
Reexamination Certificate
active
07639034
ABSTRACT:
The present invention relates to a flat display apparatus and a flat display apparatus testing method, and is, for example, applicable to a liquid crystal display apparatus where drive circuits are integrally formed on an insulating substrate. The present invention is capable of carrying out a reliable screening of defective pixels so as to effectively avoid deterioration in reliability even in cases where transistors with low withstand voltages are employed. A common line-side wiring pattern COM of wiring patterns LCC and COM of a capacitor of pixels is connected to a precharge circuit externally in an independent manner.
REFERENCES:
patent: 5382095 (1995-01-01), Akutsu
patent: 5717482 (1998-02-01), Akutsu et al.
patent: 5726548 (1998-03-01), Chiba et al.
patent: 5858587 (1999-01-01), Yamane et al.
patent: 5864389 (1999-01-01), Osanai et al.
patent: 5939852 (1999-08-01), Akutsu et al.
patent: 6008882 (1999-12-01), Ito et al.
patent: 6028376 (2000-02-01), Osanai et al.
patent: 6275061 (2001-08-01), Tomita
patent: 6285444 (2001-09-01), Osanai et al.
patent: 6638787 (2003-10-01), Buchin et al.
patent: 6658083 (2003-12-01), Sai
patent: 6791350 (2004-09-01), Taguchi
patent: 6847083 (2005-01-01), Murai
patent: 6922243 (2005-07-01), Lin et al.
patent: 6999051 (2006-02-01), Hsu
patent: 2002/0132409 (2002-09-01), Akutsu et al.
patent: 2002/0176061 (2002-11-01), Sai
patent: 2003/0006953 (2003-01-01), Yang et al.
patent: 2003/0161189 (2003-08-01), Park
patent: 2-72392 (1990-03-01), None
patent: 11-271806 (1999-10-01), None
patent: 11271806 (1999-10-01), None
Kida Yoshitoshi
Mitsui Osamu
Murase Masaki
Nakajima Yoshiharu
Ma Calvin C
Nguyen Chanh
Oblon, Spivak,McClelland, Maier & Neustadt, L.L.P.
Sony Corporation
LandOfFree
Flat display apparatus and flat display apparatus testing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Flat display apparatus and flat display apparatus testing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flat display apparatus and flat display apparatus testing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4142546