Flash array digitizer

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion

Reexamination Certificate

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Details

C341S141000, C702S067000, C377S042000

Reexamination Certificate

active

07098839

ABSTRACT:
Apparatus for rapidly acquiring a large number of samples of a signal under test, stores the samples in a waveform memory without converting the samples to binary form. The signal under test is applied to an arrangement of comparators and exclusive-OR gates to provide a signal indicative of amplitude. The waveform memory is arranged in rows and columns. In one embodiment, the amplitude-indicative signal serves as a row address signal for the waveform memory, and a scanning control signal serves as a column address signal for the waveform memory. In another embodiment, an X-Y display is produced in which the column address signal is responsive to the amplitude of a second signal under test.

REFERENCES:
patent: 4833445 (1989-05-01), Buchele
patent: 5343405 (1994-08-01), Kucera et al.
patent: 5552999 (1996-09-01), Polgreen et al.
patent: 5691664 (1997-11-01), Anderson et al.
patent: 6169503 (2001-01-01), Wong
patent: 6859375 (2005-02-01), Breton et al.
patent: 2004/0008160 (2004-01-01), Etheridge et al.
patent: 56164629 (1981-12-01), None

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