Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate
2006-08-29
2006-08-29
Williams, Howard L. (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Analog to digital conversion
C341S141000, C702S067000, C377S042000
Reexamination Certificate
active
07098839
ABSTRACT:
Apparatus for rapidly acquiring a large number of samples of a signal under test, stores the samples in a waveform memory without converting the samples to binary form. The signal under test is applied to an arrangement of comparators and exclusive-OR gates to provide a signal indicative of amplitude. The waveform memory is arranged in rows and columns. In one embodiment, the amplitude-indicative signal serves as a row address signal for the waveform memory, and a scanning control signal serves as a column address signal for the waveform memory. In another embodiment, an X-Y display is produced in which the column address signal is responsive to the amplitude of a second signal under test.
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Lenihan Thomas F.
Moser Patterson & Sheridan LLP
Tektronix Inc.
Williams Howard L.
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