Fixture for vibration testing

Details Fixture for vibration testing Fixture for vibration testing

1997-10-31

2000-03-21

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

060407034

ABSTRACT:
A testing fixture which facilitates inexpensive, high-speed dynamic testing of electronic devices without subjecting the electrical leads of the devices to damage includes a first carrier plate having a plurality of electrical contacts associated with respective electrical leads of the electronic device which is to be tested, the first carrier plate including electrical conductors electrically connected with the electrical contacts for supplying power to the electronic device and for monitoring signals from the electronic device during testing, and a second carrier plate secured to the first carrier plate, the second carrier plate including abutment surfaces which overlie the electrical contacts on the first carrier plate to retain the electrical leads on the electronic device between the electrical contacts on the first carrier plate and the abutment surfaces on the second carrier plate during testing of the electronic device. At least one of the carrier plates define an aperture in which the electronic device is generally disposed during testing, the aperture having a length and width greater than the length and width of the electronic device, so that contact between the electronic device and the printed circuit board and the clamp plate can be avoided.

REFERENCES:
patent: 3335327 (1967-08-01), Damon et al.
patent: 4766371 (1988-08-01), Moriya
patent: 5407361 (1995-04-01), Ikeya

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