Fixture for testing integrated circuits

Details Fixture for testing integrated circuits Fixture for testing integrated circuits

1978-06-02

1979-05-01

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, G01R 3122, G01R 3102

Patent

active

041526449

ABSTRACT:
The fixture comprises an insulating housing of synthetic resinous material which carries two sets of switches which number, in total, the number of terminals on an integrated circuit (IC) to be tested. Each switch has a manually operable arm or lever which can be placed in three separate positions, an upper position, a center position, and a lower position; and the switch has three terminals, an upper terminal, a center terminal, and a lower terminal, one for each position of the operable arm. All of the upper switch terminals are connected together to a first common plug, and all of the lower switch terminals are connected together to a second common plug, the two plugs being adapted to be inserted into a test device such as a curve tracer. Each center terminal is connected separately to a terminal on a zero-insertion force socket, into which the pins of the integrated circuit under test can be inserted.

REFERENCES:
dougherty, R. A.; "DIP Switch Isolates Faults in System"; Electronics, May 15, 1975, p. 112.

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