Fixed pattern compensation with adaptive window for MTF testing

Details Fixed pattern compensation with adaptive window for MTF testing Fixed pattern compensation with adaptive window for MTF testing

1997-01-29

1998-04-28

Couso, Yon

Image analysis

Image enhancement or restoration

Image filter

348618, 358468, 382275, G06K 940

Patent

active

057456097

ABSTRACT:
This invention is an apparatus and method that is able to accurately measure the system level modulation transfer function in the presence of fixed pattern noise from an imaging system electronics.

REFERENCES:
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patent: 5294075 (1994-03-01), Vertatschitsch et al.
patent: 5307175 (1994-04-01), Seachman
patent: 5504523 (1996-04-01), Wight et al.
T. L. Williams, "A workshop instrument for testing binocular and other sights using the m.t.f. criterion", Optics and Laser Technology, Jun. 1972, pp. 115-120.
T.L. Williams, "An Instrument For Measuring The MTF of Lenses Used in Thermal Imaging And Other Infrared Systems (2 to 14um)", Conference: Image Assessment & Specification, Rochester, NY, May 20-22,1974, pp. 305-311.
T.L. Williams, "Standard Reference Lenses For The Infrared", Proceedings of The Society of Photo-Optical Instrumentation Engineers, vol. 98 Assessment of Imaging System (Sira Nov. 1976 London, pp. 16-20.
R. Barakat, "Determination of The Optical Transfer Function Directly From The Edge Spread Function", Journal of The Optical Society of America, vol. 55, No. 10, Oct. 1965, pp. 1217-1221.
D.Elliott, Handbook of Digital Signal Processing Engineering Applications, Academic Press, Inc. pp. 1-33, 55-57, 172-175, 289-291, 359-361, 481-483, 527-529, 633-635, 701-703, 741-743, 788-791, 857-859, 899-901, 941-943, 975-985.

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