Measuring and testing – Surface and cutting edge testing
Patent
1980-06-18
1982-02-23
Ciarlante, Anthony V.
Measuring and testing
Surface and cutting edge testing
356 30, G01N 1908
Patent
active
043163858
ABSTRACT:
A smooth surface of a diamond or cubic boron nitride crystal is bombarded with ions sufficiently to penetrate the surface and impart an ion implanted region in the crystal in a predetermined pattern, the resulting crystal is charged electrostatically, and a powder is applied to the charged smooth surface producing a pattern thereon which is a delineation of the implanted region and can be used to identify or fingerprint the crystal.
REFERENCES:
patent: 4143544 (1979-03-01), DeVries et al.
patent: 4200506 (1980-04-01), Dreschhoff et al.
Large et al., Journal of Materials Science, vol. 2, (1967), pp. 589-609, "Ion-Implantation Doping of Semiconductors".
Chemical Abstracts, vol. 77, 54910e.
DeVries Robert C.
Tuft Roy E.
Binkowski Jane M.
Ciarlante Anthony V.
Cohen Joseph T.
Davis Jr. James C.
General Electric Company
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