Measuring and testing – Probe or probe mounting
Patent
1998-11-19
2000-02-29
Raevis, Robert
Measuring and testing
Probe or probe mounting
A61B 500
Patent
active
060295309
ABSTRACT:
An exemplary inspection apparatus for inspecting an article comprises a flexible sensor for sensing a characteristic of the article, which sensor conforms to a surface of the article, a finger cover which fits over a finger of a user, and an attachment device for removably attaching the sensor to the finger cover. The apparatus allows the user to traverse the sensor over a large range of smoothly varying concave or convex inspection surfaces, for example, while providing the user with direct control of the sensor.
REFERENCES:
patent: 4144877 (1979-03-01), Frei et al.
patent: 4167878 (1979-09-01), Bottcher et al.
patent: 4745809 (1988-05-01), Collins et al.
patent: 4897439 (1990-01-01), Rau et al.
patent: 4911172 (1990-03-01), Bui et al.
patent: 4985195 (1991-01-01), Wilson et al.
patent: 5012817 (1991-05-01), Zeilinski et al.
patent: 5050703 (1991-09-01), Graff et al.
patent: 5062298 (1991-11-01), Falcoff et al.
patent: 5070882 (1991-12-01), Bui et al.
patent: 5093403 (1992-03-01), Rau et al.
patent: 5109861 (1992-05-01), Walinsky et al.
patent: 5113566 (1992-05-01), Weekamp et al.
patent: 5182513 (1993-01-01), Young et al.
patent: 5228176 (1993-07-01), Bui et al.
patent: 5230921 (1993-07-01), Waltonen et al.
patent: 5240004 (1993-08-01), Walinsky et al.
patent: 5242976 (1993-09-01), Strassel et al.
patent: 5254296 (1993-10-01), Perlman
patent: 5262722 (1993-11-01), Hedengren et al.
patent: 5283302 (1994-02-01), Wakamori et al.
patent: 5283835 (1994-02-01), Athanas
patent: 5315234 (1994-05-01), Sutton, Jr. et al.
patent: 5344904 (1994-09-01), Wakamori et al.
patent: 5345514 (1994-09-01), Mahdavieh et al.
patent: 5367500 (1994-11-01), Ng
patent: 5371462 (1994-12-01), Hedengren et al.
patent: 5389876 (1995-02-01), Hedengren et al.
patent: 5442286 (1995-08-01), Sutton, Jr. et al.
patent: 5489406 (1996-02-01), Beck et al.
patent: 5494617 (1996-02-01), Iwamoto
patent: 5505870 (1996-04-01), Yoo et al.
patent: 5572995 (1996-11-01), Rohrberg
patent: 5801532 (1998-09-01), Patton et al.
Z. Zhang, et al, "The Modeling and Experimental Study of the Piezofilm Transducer Waveforms in Cylindrical Geometry", Review of Progress in Quantitative Nondestructive Evaluation, vol. 11, 1992, pp. 1075-1082.
D. Hsu, et al, "NDE of Cylindrically Symmetric Components with Piezofilm Transducers", Review of Progress in Quantitative Nondestructure Evaluation, vol. 11, 1992, pp. 1083-1090.
AMP, Inc., "Piezo Film Sensors Product Guide", Catalog 65711 dated Sep. 1995, pp. 1-23.
AMP, Inc., "Summary of Operating Properties: DT1-028K", Application Specification 114-1081, Nov. 24, 1994, Rev. D., pp. 1-6.
AMP, Inc., Vibration Sensor: SDT1-028K, Instruction Sheet 408-9945, Nov. 29, 1994, Rev. E, pp. 1-2.
Ktech Corp., "Piezoelectric SOLEF.RTM. PVDF Polyvinylidene Fluoride Films", pp. 1-13, No date.
Ktech Corp., Standard Polyvinylidine Fluoride (PVDF) Sensor Specification, Apr. 1995 2 pages.
Filkins Robert John
Fulton James Paul
Hedengren Kristina Helena Valborg
Patton Thadd Clark
Young John David
Breedlove Jill M.
General Electric Company
Goldman David C.
Raevis Robert
LandOfFree
Finger controlled inspection apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Finger controlled inspection apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Finger controlled inspection apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-672823