Stock material or miscellaneous articles – Coated or structually defined flake – particle – cell – strand,... – Particulate matter
Reexamination Certificate
2006-06-20
2006-06-20
Killiman, Ieszek B. (Department: 1773)
Stock material or miscellaneous articles
Coated or structually defined flake, particle, cell, strand,...
Particulate matter
C428S403000, C428S404000, C428S405000, C428S407000
Reexamination Certificate
active
07063890
ABSTRACT:
Such a structure is to be provided in that in the case where a material, such as a protective film, is coated on a fine particle accumulated layer, such as a photonic crystal, penetration of the material into gaps among the fine particles is suppressed, whereby the mechanical strength against bending stress and tensile stress is improved, and peeling and breakage of the fine particle accumulated layer are suppressed, without adverse affect on the optical characteristics, such as reflection characteristics. The fine particle structure contains a visible light absorbing material absorbing visible light as a substrate, having accumulated thereon in this order silica fine particles having a particle diameter of 290 nm as a fine particle layer for reflecting red light, silica fine particles having a particle diameter of 240 nm as a fine particle layer for reflecting green light, and silica fine particles having a particle diameter of 210 nm as a fine particle layer for reflecting blue light, and further provided thereon a polymer layer or a gelatin layer containing a polymer having a size larger than the gaps among the fine particles. The optical medium, such as a reflective type screen, further contains a diffusion film on the polymer layer or the gelatin layer.
REFERENCES:
patent: 6456416 (2002-09-01), Ichimura et al.
patent: 6465742 (2002-10-01), Hiraoka et al.
patent: 6685870 (2004-02-01), Ukechi et al.
patent: 6800709 (2004-10-01), Aert et al.
patent: 6859572 (2005-02-01), Ishibashi
Akao Hirotaka
Ishimoto Ko
Kaino Yuriko
Toda Atsushi
Frommer William S.
Frommer & Lawrence & Haug LLP
Killiman Ieszek B.
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